Portable Analyser XRF X-50

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Ask for a price Portable Analyser XRF X-50

Specification

X-Ray tube: 40kV, Rh Anode (for alloys), Au Anode (for GeoChem, Soils)
100µA
Detector: 6 mm2 standard DPP, 15k cps
Standard element package: Alloys:
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Se, Y, Zr, Nb, Mo, W, Ta, Hf, Re, Au, Pb, Bi, Ru, Pd, Ag, Cd, Sn, Sb

Precious Metals:
Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, W, Au, Ge, Ir, Pt, Au, Pb, Bi, Zr, Mo, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb

Mining:
S, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Nb, Mo, W, Ta, Au, Hg, Pb, Bi, U, Ag, Sn, Sb

Soils:
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Mo, W, Tl, Hg, Pb, Bi, Ag, Cd, Sn, Sb
Weight: 1.5 kg with battery
Operating system: Android
Dimensions: 18 x 26 x 11 cm
Display: 5" Touchscreen, Smartphone type, PowerVR SGX540 3D
PC Software: SciAps Profile Builder

Description

Portable Analyser XRF X-50

The X-50 features PiN diode technology, which is the previous generation detector prior to the advent of silicon drift detectors. The PiN technology processes a factor of 10x – 20x lower X-ray rates than the silicon drift detectors, and has resolution that is about 100 eV less (greater width). However for many applications such as basic sorting of stainless, high temp and copper alloys, or analyze base or heavy metals in soils, ores, powders, etc. the PiN technology is satisfactory. The X-50 will NOT measure Mg, Al or Si, and in some materials can measure P and S at the 1% level. Limits of detection will be 5x higher (elevated) compared to SDD versions of the X. However the X-50 features an attractive price point for the applications that work well. The X-50 includes the same advanced X-ray tube as other X models (operating at 40 kV max.), integrated camera, video, and the Android OS platform. The X-50 is available for alloy, environmental, mining/exploration, industrial and user-customizable applications. Analyzers may be factory calibrated with fundamental parameters, Compton Normalization (EPA Method 6200), or user defined empirical calibrations.